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Test Point Insertion: Observation TP, Control TP

Updated 18 May 2026

Contents & prerequisites

Prerequisites

Timing-Aware ATPG: Critical Path Delay Fault Patterns

Unlocks

Scan Ordering: Timing-Driven, Power-Aware Scan Chain

Article in preparation

Test Point Insertion: Observation TP, Control TP

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Learning

PreviousTest Coverage Target: 99%+ Stuck-At for Production NextTiming-Aware ATPG: Critical Path Delay Fault Patterns

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